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Experimental survey of chaos in the Josephson effect

Identifieur interne : 000644 ( Main/Exploration ); précédent : 000643; suivant : 000645

Experimental survey of chaos in the Josephson effect

Auteurs : RBID : ISTEX:10909_1986_Article_BF00685131.pdf

Abstract

The range of chaotic behavior in the Josephson effect is investigated experimentally in tin tunnel junctions and indium microbridges subjected to dc and rf bias. Chaos is found to occur between frequencies of 0.1/(2πRC) and the plasma frequency at intermediate hysteresis. The low-hysteresis onset of chaos is studied systematically by varying the critical current of an Sn/ox/Sn tunnel junction as a function of temperature. The results agree with simulations and theoretical predictions.

DOI: 10.1007/BF00685131

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<div type="abstract" xml:lang="eng">The range of chaotic behavior in the Josephson effect is investigated experimentally in tin tunnel junctions and indium microbridges subjected to dc and rf bias. Chaos is found to occur between frequencies of 0.1/(2πRC) and the plasma frequency at intermediate hysteresis. The low-hysteresis onset of chaos is studied systematically by varying the critical current of an Sn/ox/Sn tunnel junction as a function of temperature. The results agree with simulations and theoretical predictions.</div>
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<abstract lang="eng">The range of chaotic behavior in the Josephson effect is investigated experimentally in tin tunnel junctions and indium microbridges subjected to dc and rf bias. Chaos is found to occur between frequencies of 0.1/(2πRC) and the plasma frequency at intermediate hysteresis. The low-hysteresis onset of chaos is studied systematically by varying the critical current of an Sn/ox/Sn tunnel junction as a function of temperature. The results agree with simulations and theoretical predictions.</abstract>
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